Power-constrained Testing Of Vlsi Circuits: A Guide To The Ieee 1149.4 Test Standard (frontiers In Electronic Testing)

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Brand: Springer
SKU: DADAX140207235X
ISBN : 140207235X

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Author : Nicola Nicolici
ISBN : 140207235X
Language : English
No of Pages : 178
Edition : 2003
Publication Date : 2/28/2003
Format/Binding : Hardcover
Book dimensions : 9.64x6.42x0.56
Book weight : 0.01

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