Power-Constrained Testing Of VLSI Circuits: A Guide To The IEEE 1149.4 Test Standard (Frontiers In Electronic Testing)

Brand: Springer
SKU: DADAX140207235X
ISBN : 9781402072352
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Specifications of Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

GENERAL
AuthorNicola Nicolici, Bashir M. Al-Hashimi
BindingHardcover
LanguageEnglish
Edition2003
ISBN-10140207235X
ISBN-139781402072352
PublisherSpringer
Number Of Pages178
Publication Date2003-02-28
DIMENSIONS
Height9.21 inch.
Length6.14 inch.
Width0.5 inch.
Weight1.05 pounds.

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