Semiconductor Material And Device Characterization

Brand: Wiley-IEEE Press
SKU: DADAX0471739065
ISBN : 9780471739067
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Semiconductor Material and Device Characterization

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.

Specifications of Semiconductor Material and Device Characterization

GENERAL
AuthorDieter K. Schroder
BindingHardcover
LanguageEnglish
Edition3
ISBN-100471739065
ISBN-139780471739067
PublisherWiley-IEEE Press
Number Of Pages800
Publication Date2015-06-29
DIMENSIONS
Height9.7 inch.
Length6.4 inch.
Width1.9 inch.
Weight2.65 pounds.

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