VLSI Test Principles And Architectures: Design For Testability (The Morgan Kaufmann Series In Systems On Silicon)

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.