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VLSI Test Principles And Architectures: Design For Testability (The Morgan Kaufmann Series In Systems On Silicon)
Publisher: Morgan Kaufmann
SKU: DADAX0123705975
ISBN : 9780123705976
Condition : New
SKU: DADAX0123705975
ISBN : 9780123705976
Condition : New
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$72.01
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Specification of VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
GENERAL | |
---|---|
Author | Laung-Terng Wang |
Binding | Hardcover |
Language | English |
Edition | 1 |
ISBN-10 | 0123705975 |
ISBN-13 | 9780123705976 |
Publisher | Morgan Kaufmann |
Publication Date | 2006 |
DIMENSIONS | |
---|---|
Height | 9.25 inch. |
Length | 2 inch. |
Width | 7.5 inch. |
Weight | 3.95 pounds pounds. |
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