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Scanning Electron Microscopy And X-ray Microanalysis: Third Edition
Publisher: Addison Wesley
SKU: DADAX0306472929
ISBN : 9780306472923
Condition : New
SKU: DADAX0306472929
ISBN : 9780306472923
Condition : New
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$109.14
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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Specifications of Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
| GENERAL | |
|---|---|
| Author | Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman |
| Binding | Hardcover |
| Language | English |
| Edition | 3rd |
| ISBN-10 | 0306472929 |
| ISBN-13 | 9780306472923 |
| Publisher | Springer |
| Number Of Pages | 689 |
| Publication Date | 2003-02 |
| DIMENSIONS | |
|---|---|
| Height | 9.9 inch. |
| Length | 7.3 inch. |
| Width | 1.4 inch. |
| Weight | 2.9 pounds. |
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