Testing Of Digital Systems

Testing Of Digital Systems

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.Book DescriptionThe most comprehensive and wide ranging book on the testing of semiconductor devices and systems.Book DescriptionAs the complexity of modern digital systems increases, so does the need for ever more rigorous testing at all levels, from individual chips up to complete system architectures. This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing. It covers every key topic, including fault simulation, CMOS testing, design for testability, and built-in self test. The book is aimed at graduate students of electrical and computer engineering, and is the most up-to-date reference volume on the market for practicing engineers.About the AuthorNiraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.