An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17),Used
An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17),Used

An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17),Used

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SKU: SONG1598293508
Brand: Morgan & Claypool Publishers
Condition: Used
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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for seniorlevel undergraduate and firstyear graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc designfortestability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (builtin selftest) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Builtin SelfTest / References

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