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If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.
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All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com
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When cobalt is evaporated under ultra high vacuum conditions conditions onto a heated silicon substrate, the cobalt reacts with the silicon and cobalt silicides are formed directly a process which is referred to as reactive deposition. If the substrate temperature is maintained above 550C a CoSi2 film is produced, while at substrate temperatures below 500C the film is in the form of CoSi. At intermediate temperatures a mixed mono/disilicide film is produced. A combination of realtime RBS and realtime XRD has been used to study the effect of the temperature of reactive deposition used to produce CoSi on the subsequent formation temperature of CoSi2. Realtime XRD proved to be a very convenient method for determining the temperature of onset of CoSi2 formation, while realtime RBS is able to provide detailed information about the rate of disilicide formation. The results of the investigation show that the temperature at which the reactive deposition was carried out had a significant effect on the formation temperature of CoSi2: the lower the reactive deposition temperature used to form the CoSi film, the higher the subsequent formation temperature of CoSi2.
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