Crystalline Silicon Surface Passivation by Amorphous Silicon Compounds: Modeling, experiments, solar cells and modules,Used

Crystalline Silicon Surface Passivation by Amorphous Silicon Compounds: Modeling, experiments, solar cells and modules,Used

In Stock
SKU: DADAX3838128796
Brand: Sudwestdeutscher Verlag Fur Hochschulschriften AG
Condition: New
Regular price$101.27
Quantity
Add to wishlist
Add to compare

Sold by Ergodebooks, an authorized reseller.

Returns accepted within 30 days | support@ergodebooks.com

Verified
Shipping Information
  • Free Standard Shipping — United States only
  • Processing Time: 1–3 business days
  • Estimated Delivery: 3–5 business days after dispatch
  • Double-boxed, fully insured & discreetly packaged
  • Tracking number sent via email once dispatched
  • Orders over $250 require signature upon delivery. Taxes calculated at checkout.
Returns & Refund

Returns accepted within 30 days of delivery.

Damaged or Defective Item

Free return shipping + replacement or full refund

Wrong Item Received

Free return shipping + replacement or full refund

Change of Mind

Return shipping at customer's expense · 25% restocking fee applies

All returns require a Return Authorization (RA) number before sending.

To initiate a return, contact us:

support@ergodebooks.com +1 (281) 738-1050
View Full Return & Refund Policy
Payment Option
Payment Methods

Help

If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.

Customer service

All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com

Sale & Press

If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com

Solar cells based on crystalline silicon (cSi) have the potential to make photovoltaic electricity cheaper than coalbased electric power generation within less than 10 years. The largest cost decrease potential on the cell level lies with improved electronic surface passivation. In this work, the current industry standard, amorphous silicon nitride (aSiNx:H) deposited by Plasma Enhanced Chemical Vapor Deposition (PECVD), is investigated and compared to amorphous silicon carbide, silicon carbonitride and silicon oxynitride films deposited by both high and for the first time also lowfrequency (LF) PECVD. It is shown that and an explanation offered as to why LF PECVD is capable of excellent surface passivation, comparable to remoteplasma results in literature and higher than previously published for LF PECVD. The achieved surface passivation quality is sufficient for dielectric rearsurface passivation without an underlying diffused back surface field. It is also shown that the purity grade of precursor gases used for film deposition can be lowered significantly without affecting cell efficiency and longterm stability on the module level, allowing for further cost reduction.

⚠️ WARNING (California Proposition 65):

This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

For more information, please visit www.P65Warnings.ca.gov.

Recently Viewed