If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.
Customer service
All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com
Sale & Press
If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com
Help
If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.
Customer service
All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com
Sale & Press
If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com
In The Early Days Of Digital Design, We Were Concerned With The Logical Correctness Of Circuits. We Knew That If We Slowed Down The Clock Signal Sufficiently, The Circuit Would Function Correctly. With Improvements In The Semiconductor Process Technology, Our Expectations On Speed Have Soared. A Frequently Asked Question In The Last Decade Has Been How Fast Can The Clock Run. This Puts Significant Demands On Timing Analysis And Delay Testing. Fueled By The Above Events, A Tremendous Growth Has Occurred In The Research On Delay Testing. Recent Work Includes Fault Models, Algorithms For Test Generation And Fault Simulation, And Methods For Design And Synthesis For Testability. The Authors Of This Book, Angela Krstic And Tim Cheng, Have Personally Contributed To This Research. Now They Do An Even Greater Service To The Profession By Collecting The Work Of A Large Number Of Researchers. In Addition To Expounding Such A Great Deal Of Information, They Have Delivered It With Utmost Clarity. To Further The Reader'S Understanding Many Key Concepts Are Illustrated By Simple Examples. The Basic Ideas Of Delay Testing Have Reached A Level Of Maturity That Makes Them Suitable For Practice. In That Sense, This Book Is The Best X Delay Fault Testing For Vlsi Circuits Available Guide For An Engineer Designing Or Testing Vlsi Systems. Tech Niques For Path Delay Testing And For Use Of Slower Test Equipment To Test Highspeed Circuits Are Of Particular Interest.
⚠️ WARNING (California Proposition 65):
This product may contain chemicals known to the State of California to cause cancer,
birth defects, or other reproductive harm.
For MAP (Minimum Advertised Price) violations and Intellectual Property (IP) or Trademark concerns, please contact:
support@ergodebooks.com
⚠️ California Proposition 65 Warning: Some products sold on this website may expose you to chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm. For more information, visit www.P65Warnings.ca.gov.
