Electron Microprobe Analysis and Scanning Electron Microscopy in Geology,Used

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology,Used

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SKU: SONG052114230X
UPC: 9780521142304
Brand: Cambridge University Press
Condition: Used
Regular price$71.21
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Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electrontarget interactions, electron beam instrumentation, Xray spectrometry, general principles of SEM image formation, production of Xray 'maps' showing elemental distributions, procedures for qualitative and quantitative Xray analysis (both energydispersive and wavelengthdispersive), the use of both 'true' electron microprobes and SEMs fitted with Xray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

⚠️ WARNING (California Proposition 65):

This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

For more information, please visit www.P65Warnings.ca.gov.

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