High Resolution XRay Diffractometry And Topography,Used

High Resolution XRay Diffractometry And Topography,Used

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SKU: SONG0850667585
UPC: 9780850667585
Brand: CRC Press
Condition: Used
$272.89
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The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of xray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of highresolution xray diffraction and topography. It combines mathematical formalisms with graphical explanations and handson practical advice for interpreting data.

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This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

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