Ion Emission from MetalOrganic Nanosystems upon Ion/Photon Impact: Metal Assisted Secondary Ion Mass Spectrometry and Metal Ass,Used

Ion Emission from MetalOrganic Nanosystems upon Ion/Photon Impact: Metal Assisted Secondary Ion Mass Spectrometry and Metal Ass,Used

In Stock
SKU: DADAX365930929X
UPC: 9783659309298
Brand: LAP Lambert Academic Publishing
Condition: New
Regular price$111.59
Free Standard Shipping Across USA
Quantity
Add to wishlist
Add to compare

Sold by Ergodebooks, an authorized reseller.

Returns accepted within 30 days | support@ergodebooks.com

Verified
Shipping Information
  • Free Standard Shipping — United States only
  • Processing Time: 3–5 business days
  • Estimated Delivery: 6–10 business days after dispatch
  • Double-boxed, fully insured & discreetly packaged
  • Tracking number sent via email once dispatched
Returns & Refund

Returns accepted within 30 days of delivery.

Damaged or Defective Item

Free return shipping + replacement or full refund

Wrong Item Received

Free return shipping + replacement or full refund

Change of Mind

Return shipping at customer's expense · 25% restocking fee applies

All returns require a Return Authorization (RA) number before sending.

To initiate a return, contact us:

support@ergodebooks.com +1 (281) 738-1050
View Full Return & Refund Policy
Payment Option
Payment Methods

Help

If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.

Customer service

All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com

Sale & Press

If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com

Secondary ion mass spectrometry (SIMS), in which energetic ions are implemented to interrogate the surface, is an efficient technique for the molecular analysis and imaging of solid surfaces. Improving the yield of secondary ions remains a challenge in SIMS. MetalAssisted SIMS (MetA SIMS), where a small quantity of metal (Au, Ag, Pt) is condensed on the sample surface, was one among the proposed ways to increase the yield using keV monatomic projectiles. In this thesis, the yield enhancements obtained upon 12 keV Ga+, 30 keV Bin+ (n =1,3,5) and 6MeV O3+ bombardment on metal deposited organic materials are investigated. Following from the studies in Metal Assisted Secondary Ion Mass Spectrometry (MetA SIMS), gold nanoparticles condensed on the surface of organic materials were used as an alternative to the MatrixAssisted Laser Desorption Ionization (MALDI). The results suggest that MetalAssisted LDI (MetA LDI) provides an interesting alternative to MALDI for the surface analysis and, potentially, imaging of certain classes of materials, when a minimal perturbation of the surface structure is desired.

⚠️ WARNING (California Proposition 65):

This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

For more information, please visit www.P65Warnings.ca.gov.

Recently Viewed