Title
Logic Testing And Design For Testability (Mit Press Series In Computer Systems)
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Today'S Computers Must Perform With Increasing Reliability, Which In Turn Depends On The Problem Of Determining Whether A Circuit Has Been Manufactured Properly Or Behaves Correctly. However, The Greater Circuit Density Of Vlsi Circuits And Systems Has Made Testing More Difficult And Costly. This Book Notes That One Solution Is To Develop Faster And More Efficient Algorithms To Generate Test Patterns Or Use Design Techniques To Enhance Testabilitythat Is, Design For Testability. Design For Testability Techniques Offer One Approach Toward Alleviating This Situation By Adding Enough Extra Circuitry To A Circuit Or Chip To Reduce The Complexity Of Testing. Because The Cost Of Hardware Is Decreasing As The Cost Of Testing Rises, There Is Now A Growing Interest In These Techniques For Vlsi Circuits.The First Half Of The Book Focuses On The Problem Of Testing: Test Generation, Fault Simulation, And Complexity Of Testing. The Second Half Takes Up The Problem Of Design For Testability: Design Techniques To Minimize Test Application And/Or Test Generation Cost, Scan Design For Sequential Logic Circuits, Compact Testing, Builtin Testing, And Various Design Techniques For Testable Systems.Hideo Fujiwara Is An Associate Professor In The Department Of Electronics And Communication, Meiji University. Logic Testing And Design For Testability Is Included In The Computer Systems Series, Edited By Herb Schwetman.
⚠️ WARNING (California Proposition 65):
This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.
For more information, please visit www.P65Warnings.ca.gov.
- Q: How many pages does this book have? A: This book has two hundred ninety-eight pages. It's a comprehensive resource for those interested in logic testing and design for testability.
- Q: What type of binding does this book have? A: This book is bound in hardcover. The hardcover format ensures durability and longevity for frequent use.
- Q: Who is the author of this book? A: The author of this book is Hideo Fujiwara. He is an associate professor in the Department of Electronics and Communication at Meiji University.
- Q: What topics are covered in this book? A: This book covers logic testing, design for testability, test generation, and fault simulation. It addresses both theoretical and practical aspects of these topics.
- Q: What is the target audience for this book? A: This book is aimed at students, professionals, and researchers in computer science. It's particularly suitable for those focusing on VLSI circuits and testing methodologies.
- Q: Is this book suitable for beginners? A: Yes, this book is suitable for beginners with an interest in logic testing. It provides foundational knowledge as well as advanced techniques.
- Q: How can I apply the concepts from this book? A: You can apply the concepts by implementing test generation algorithms and design for testability techniques in your projects. Practical examples are provided throughout the book.
- Q: Are there any exercises or practical examples in the book? A: Yes, the book includes practical examples and exercises. These are designed to reinforce the concepts discussed in each chapter.
- Q: What is the best way to care for this book? A: To care for this book, keep it in a dry, cool place and avoid exposure to direct sunlight. This will help maintain its condition over time.
- Q: Is this book safe for all ages? A: Yes, this book is appropriate for all ages, particularly for those studying computer science. It contains no adult content.
- Q: What if the book arrives damaged? A: If the book arrives damaged, you should contact the seller for return options. Many sellers offer a satisfaction guarantee.
- Q: Can I return this book if I don't find it useful? A: Yes, you can return the book if it does not meet your expectations. Check the specific return policy of the seller for details.
- Q: Is there a warranty on this book? A: No, books typically do not come with a warranty. However, you can check the seller’s return policy for any guarantees.
- Q: What is the genre of this book? A: This book falls under the genre of Computer Science. It specifically focuses on topics related to logic testing and design.
- Q: How does this book compare to other titles in its field? A: This book is unique for its focus on design for testability, a crucial aspect of VLSI circuit testing. It provides both theoretical insights and practical applications.
- Q: Is this book included in any series? A: Yes, this book is part of the Mit Press Series in Computer Systems. It is edited by Herb Schwetman, ensuring a high standard of content.