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Multirun Memory Tests for Pattern Sensitive Faults,Used
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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multicell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multirun transparent march testing processes. Formal methods for multirun test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multicell fault detection by multirun tests in memory testing process;Presents practical algorithms for design and implementation of efficient multirun tests;Demonstrates methods verified by analytical and experimental investigations.
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