Nearfield Characterization of Photonic Nanodevices: Nearfield Scanning Optical Microscopy (NSOM) characterization of photonic ,Used

Nearfield Characterization of Photonic Nanodevices: Nearfield Scanning Optical Microscopy (NSOM) characterization of photonic ,Used

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SKU: DADAX3838307119
Brand: LAP Lambert Academic Publishing
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The increasing density of data transmission, speed of alloptical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signaltonoise performance in nearfield microscopy. The book describes a Heterodyne Near field Scanning Optical Microscope (HNSOM) and applications of this approach to characterization of several classes of the photonic nanodevices.

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