PowerConstrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B),Used

PowerConstrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B),Used

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Brand: Springer
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This text focuses on techniques for minimizing power dissipation during test application at logic and registertransfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scanbased sequential circuits and BIST data paths.

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