Title
Scanning Electron Microscopy and XRay Microanalysis: A Text for Biologists, Materials Scientists, and Geologists,Used
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In the last decade, since the publication of the first edition of Scanning Electron Microscopy and Xray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Lowvoltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of xray wavelength and energy dispersive spectrometers allow for the measurement of lowenergy xrays, particularly from the light elements (B, C, N, 0). In the area of xray microanalysis, great advances have been made, particularly with the 'phi rho z' [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, xray imaging has advanced from the conventional technique of 'dot mapping' to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.'
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- Q: What is the main focus of the book 'Scanning Electron Microscopy and X-Ray Microanalysis'? A: The book primarily focuses on the advancements in scanning electron microscopy (SEM) and x-ray microanalysis, detailing techniques and applications relevant to biologists, materials scientists, and geologists.
- Q: Who is the author of 'Scanning Electron Microscopy and X-Ray Microanalysis'? A: The author of the book is Joseph I. Goldstein.
- Q: What are the key features of the second edition of this book? A: The second edition includes updated information on high-resolution imaging, low-voltage microscopy, and advancements in x-ray wavelength and energy dispersive spectrometers.
- Q: How many pages does 'Scanning Electron Microscopy and X-Ray Microanalysis' have? A: The book contains 840 pages.
- Q: What is the publication date of this book? A: The book was published on May 31, 1992.
- Q: Is this book suitable for beginners in microscopy? A: While the book contains valuable information, it is more suited for readers with a background in biology, materials science, or geology, rather than complete beginners.
- Q: What type of binding does this book have? A: The book is available in hardcover binding.
- Q: In what condition is the book being sold? A: The book is listed in acceptable condition, which may include signs of wear.
- Q: Does this book cover recent advancements in microscopy? A: Yes, it discusses recent advancements in SEM and x-ray microanalysis techniques, including quantitative compositional imaging and software developments.
- Q: What disciplines can benefit from the knowledge presented in this book? A: This book can benefit professionals and students in cell biology, materials science, and geology.