Title
Semiconductor Material And Device Characterization,Used
Delivery time: 8-12 business days (International)
This Third Edition Updates A Landmark Text With The Latest Findingsthe Third Edition Of The Internationally Lauded Semiconductor Material And Device Characterization Brings The Text Fully Uptodate With The Latest Developments In The Field And Includes New Pedagogical Tools To Assist Readers. Not Only Does The Third Edition Set Forth All The Latest Measurement Techniques, But It Also Examines New Interpretations And New Applications Of Existing Techniques.Semiconductor Material And Device Characterization Remains The Sole Text Dedicated To Characterization Techniques For Measuring Semiconductor Materials And Devices. Coverage Includes The Full Range Of Electrical And Optical Characterization Methods, Including The More Specialized Chemical And Physical Techniques. Readers Familiar With The Previous Two Editions Will Discover A Thoroughly Revised And Updated Third Edition, Including: Updated And Revised Figures And Examples Reflecting The Most Current Data And Information 260 New References Offering Access To The Latest Research And Discussions In Specialized Topics New Problems And Review Questions At The End Of Each Chapter To Test Readers' Understanding Of The Materialin Addition, Readers Will Find Fully Updated And Revised Sections In Each Chapter.Plus, Two New Chapters Have Been Added: Chargebased And Probe Characterization Introduces Chargebased Measurement And Kelvin Probes. This Chapter Also Examines Probebased Measurements, Including Scanning Capacitance, Scanning Kelvin Force, Scanning Spreading Resistance, And Ballistic Electron Emission Microscopy. Reliability And Failure Analysis Examines Failure Times And Distribution Functions, And Discusses Electromigration, Hot Carriers, Gate Oxide Integrity, Negative Bias Temperature Instability, Stressinduced Leakage Current, And Electrostatic Discharge.Written By An Internationally Recognized Authority In The Field, Semiconductor Material And Device Characterization Remains Essential Reading For Graduate Students As Well As For Professionals Working In The Field Of Semiconductor Devices And Materials.An Instructor'S Manual Presenting Detailed Solutions To All The Problems In The Book Is Available From The Wiley Editorial Department.
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Shipping & Returns
Shipping
We ship your order within 2–3 business days for USA deliveries and 5–8 business days for international shipments. Once your package has been dispatched from our warehouse, you'll receive an email confirmation with a tracking number, allowing you to track the status of your delivery.
Returns
To facilitate a smooth return process, a Return Authorization (RA) Number is required for all returns. Returns without a valid RA number will be declined and may incur additional fees. You can request an RA number within 15 days of the original delivery date. For more details, please refer to our Return & Refund Policy page.
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Warranty
We provide a 2-year limited warranty, from the date of purchase for all our products.
If you believe you have received a defective product, or are experiencing any problems with your product, please contact us.
This warranty strictly does not cover damages that arose from negligence, misuse, wear and tear, or not in accordance with product instructions (dropping the product, etc.).
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Your payment information is processed securely. We do not store credit card details nor have access to your credit card information.
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