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This Third Edition Updates A Landmark Text With The Latest Findingsthe Third Edition Of The Internationally Lauded Semiconductor Material And Device Characterization Brings The Text Fully Uptodate With The Latest Developments In The Field And Includes New Pedagogical Tools To Assist Readers. Not Only Does The Third Edition Set Forth All The Latest Measurement Techniques, But It Also Examines New Interpretations And New Applications Of Existing Techniques.Semiconductor Material And Device Characterization Remains The Sole Text Dedicated To Characterization Techniques For Measuring Semiconductor Materials And Devices. Coverage Includes The Full Range Of Electrical And Optical Characterization Methods, Including The More Specialized Chemical And Physical Techniques. Readers Familiar With The Previous Two Editions Will Discover A Thoroughly Revised And Updated Third Edition, Including: Updated And Revised Figures And Examples Reflecting The Most Current Data And Information 260 New References Offering Access To The Latest Research And Discussions In Specialized Topics New Problems And Review Questions At The End Of Each Chapter To Test Readers' Understanding Of The Materialin Addition, Readers Will Find Fully Updated And Revised Sections In Each Chapter.Plus, Two New Chapters Have Been Added: Chargebased And Probe Characterization Introduces Chargebased Measurement And Kelvin Probes. This Chapter Also Examines Probebased Measurements, Including Scanning Capacitance, Scanning Kelvin Force, Scanning Spreading Resistance, And Ballistic Electron Emission Microscopy. Reliability And Failure Analysis Examines Failure Times And Distribution Functions, And Discusses Electromigration, Hot Carriers, Gate Oxide Integrity, Negative Bias Temperature Instability, Stressinduced Leakage Current, And Electrostatic Discharge.Written By An Internationally Recognized Authority In The Field, Semiconductor Material And Device Characterization Remains Essential Reading For Graduate Students As Well As For Professionals Working In The Field Of Semiconductor Devices And Materials.An Instructor'S Manual Presenting Detailed Solutions To All The Problems In The Book Is Available From The Wiley Editorial Department.
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- Q: How many pages does this book have? A: This book has eight hundred pages. It provides in-depth coverage of semiconductor materials and device characterization.
- Q: What is the binding type of this book? A: The binding type of this book is hardcover. This ensures durability and longevity for extensive use.
- Q: What are the dimensions of this book? A: The dimensions of this book are six point four two inches in length, two point zero one inches in width, and nine point four one inches in height. These measurements make it a standard-sized reference book.
- Q: Who is the author of this book? A: The author of this book is Dieter K. Schroder. He is recognized as an authority in the field of semiconductor materials.
- Q: What is the main focus of this book? A: The main focus of this book is on semiconductor materials and device characterization techniques. It covers the latest developments and measurement methods in this field.
- Q: Is this book suitable for beginners? A: Yes, this book is suitable for both graduate students and professionals. It provides comprehensive details suitable for various levels of understanding.
- Q: Does this book include practice questions? A: Yes, it includes new problems and review questions at the end of each chapter. These are designed to test readers' understanding of the material.
- Q: Are there any new chapters in this edition? A: Yes, two new chapters have been added in this edition. They cover Charge-Based Characterization and Reliability and Failure Analysis.
- Q: Can I find a solutions manual for this book? A: Yes, an Instructor's Manual is available, presenting detailed solutions to all the problems in the book. This can be obtained from the Wiley editorial department.
- Q: What kind of illustrations does this book contain? A: This book contains updated and revised figures and examples. They reflect the most current data and information in the field.
- Q: Is there a focus on practical applications in this book? A: Yes, the book examines new interpretations and applications of existing measurement techniques. This makes it relevant for practical use in the industry.
- Q: How is the content structured in this book? A: The content is structured into detailed chapters that cover a variety of electrical and optical characterization methods in depth. Each chapter is thoroughly revised and updated.
- Q: Does this book discuss failure analysis? A: Yes, it includes a chapter on Reliability and Failure Analysis. This chapter discusses critical topics such as electromigration and gate oxide integrity.
- Q: Is this book intended for professionals? A: Yes, this book is essential reading for professionals working in the field of semiconductor devices and materials. It provides advanced insights into characterization techniques.
- Q: What publisher released this book? A: This book is published by Wiley-IEEE Press. Wiley is known for its academic and professional publications.
- Q: Does this book cover both electrical and optical methods? A: Yes, it covers a full range of electrical and optical characterization methods, along with specialized chemical and physical techniques.