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SystemonChip Test Architectures: Nanometer Design for Testability (Volume .) (Systems on Silicon, Volume .),New
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performancecapacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and DesignforTestability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly SystemonChip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixedsignal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most uptodate coverage available, including Fault Tolerance, LowPower Testing, Defect and Error Tolerance, NetworkonChip (NOC) Testing, SoftwareBased SelfTesting, FPGA Testing, MEMS Testing, and SystemInPackage (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and selfrepair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including QuantumDots, Cellular Automata, CarbonNanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.
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