Testing Sequence Dependent Defects: New Methods of Applying Twopattern Tests and Testing Sequence Dependent Defects,Used

Testing Sequence Dependent Defects: New Methods of Applying Twopattern Tests and Testing Sequence Dependent Defects,Used

In Stock
SKU: DADAX3838312198
Brand: LAP Lambert Academic Publishing
$92.41 $132.01
Save $39.60
Quantity
Add to wishlist
Add to compare

Processing time: 1-3 days

US Orders Ships in: 3-5 days

International Orders Ships in: 8-12 days

Return Policy: 15-days return on defective items

Payment Option
Payment Methods

Help

If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.

Customer service

All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com

Sale & Press

If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com

With new technologies that continue to shrink the feature size of integrated circuits into deep submicron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Twopattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuckat fault model. In this work we present methods of generating and applying twopattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuckopen faults etc.

⚠️ WARNING (California Proposition 65):

This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

For more information, please visit www.P65Warnings.ca.gov.

Recently Viewed