Vlsi Test Principles And Architectures: Design For Testability (Morgan Kaufmann Series In Systems On Silicon (Hardcover))-new
Vlsi Test Principles And Architectures: Design For Testability (Morgan Kaufmann Series In Systems On Silicon (Hardcover))-new

Vlsi Test Principles And Architectures: Design For Testability (Morgan Kaufmann Series In Systems On Silicon (Hardcover))-new

In Stock
SKU: DADAX0123705975
Brand: Morgan Kaufmann
Sale price$104.35 Regular price$149.07
Save $44.72
Quantity
Add to wishlist
Add to compare

Processing time: 1-3 days

US Orders Ships in: 3-5 days

International Orders Ships in: 8-12 days

Return Policy: 15-days return on defective items

Payment Option
Payment Methods

Help

If you have any questions, you are always welcome to contact us. We'll get back to you as soon as possible, withing 24 hours on weekdays.

Customer service

All questions about your order, return and delivery must be sent to our customer service team by e-mail at yourstore@yourdomain.com

Sale & Press

If you are interested in selling our products, need more information about our brand or wish to make a collaboration, please contact us at press@yourdomain.com

This Book Is A Comprehensive Guide To New Dft Methods That Will Show The Readers How To Design A Testable And Quality Product, Drive Down Test Cost, Improve Product Quality And Yield, And Speed Up Timetomarket And Timetovolume. Most Uptodate Coverage Of Design For Testability. Coverage Of Industry Practices Commonly Found In Commercial Dft Tools But Not Discussed In Other Books. Numerous, Practical Examples In Each Chapter Illustrating Basic Vlsi Test Principles And Dft Architectures.

⚠️ WARNING (California Proposition 65):

This product may contain chemicals known to the State of California to cause cancer, birth defects, or other reproductive harm.

For more information, please visit www.P65Warnings.ca.gov.

Recently Viewed