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Applications Of Finite Element Methods For Reliability Studies On Ulsi Interconnections (Springer Series In Reliability Engineer,Used Applications Of Finite Element Methods For Reliability Studies On Ulsi Interconnections (Springer Series In Reliability Engineer,Used
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Applications Of Finite Element Methods For Reliability Studies On Ulsi...
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the...
Sale price$53.07 Regular price$75.81
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Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology),Used Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology),Used
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Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences...
Integrated circuit (IC) reliability is of increasing concern in presentday IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing...
Sale price$75.04 Regular price$107.20
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