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PowerConstrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B),Used PowerConstrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B),Used
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PowerConstrained Testing of VLSI Circuits: A Guide to the IEEE...
This text focuses on techniques for minimizing power dissipation during test application at logic and registertransfer levels of abstraction of the VLSI design flow. It...
Sale price$54.85 Regular price$78.36
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