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DesignforTest and Test Optimization Techniques for TSVbased 3D Stacked ICs,Used DesignforTest and Test Optimization Techniques for TSVbased 3D Stacked ICs,Used
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DesignforTest and Test Optimization Techniques for TSVbased 3D Stacked ICs,Used
This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize throughsiliconvias (TSVs) as vertical interconnects. The authors...
Sale price$117.54 Regular price$167.91
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